Test and diagnosis of semiconductors
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United States of America Patent
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Jul 20, 2010
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N/A
app pub date -
Feb 20, 2007
filing date -
May 12, 2006
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Expired
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Abstract
A method and system for performing diagnosing in an automatic test environment. The method begins by determining a fail condition during a test of a device under test (DUT). A diagnostic suite is determined for testing the fail condition. The diagnostic suite is generated if the diagnostic suite is not available for access.
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