Method and apparatus for manufacturing a zinc oxide thin film at low temperatures

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United States of America Patent

PATENT NO 7744965
APP PUB NO 20070042216A1
SERIAL NO

11377204

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Abstract

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The present invention provides a method and apparatus for forming a zinc oxide thin film with high transparency and high conductivity on a surface of a flexible substrate such as plastic without the indispensable requirement of doping impurities. In the method of forming a zinc oxide thin film by reacting oxygen radicals and zinc atoms on a surface of a substrate placed in a film-forming chamber evacuated to a vacuum, the density of crystal defects that are defects of the atomic arrangement of the zinc oxide thin film is controlled by the temperature of the substrate, and the zinc oxide thin film is thereby formed. It is suitable to form the film while maintaining the temperature of the substrate at 400° C. or less to intentionally disturb the regularity of the atomic arrangement of the zinc oxide thin film.

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Patent Owner(s)

Patent OwnerAddress
YAMANASHI UNIVERSITY4-37 TAKEDA 4-CHOME KOFU-SHI YAMANASHI 400-8510
YAMANASHI PREFECTURE1-6-4 MARUNOUCHI KOFU-SHI YAMANASHI
NAKAYA LTD1641-8 TSUIJIARAI SHOWA-CHO NAKAKOMA-GUN YAMANASHI 409-3853

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abe, Osamu Yamanashi, JP 36 381
Fujikawa, Yuichiro Yamanashi, JP 14 957
Hagihara, Shigeru Yamanashi, JP 3 65
Hiraki, Satoshi Yamanashi, JP 1 11
Imazu, Chitake Yamanashi, JP 1 11
Kijima, Kazuhiro Yamanashi, JP 15 40
Matsumoto, Takashi Yamanashi, JP 582 7879

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