Reflectivity/emissivity measurement probe insensitive to variations in probe-to-target distance
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United States of America Patent
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Jun 22, 2010
Grant Date -
Feb 12, 2009
app pub date -
Aug 6, 2007
filing date -
Aug 6, 2007
priority date (Note) -
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Abstract
Apparatuses and methods for accurately measuring the reflectivity of a target surface, under conditions where the distance between a measuring probe and the target surface is not fixed. At least two measurements of the target reflectivity are taken under different conditions, and then these two or more measurements are combined in order to calculate the target reflectivity in a way which is independent of the probe-to-target distance. In particular, the different conditions are such that each measurement samples radiation reflected from the target surface at a different distribution of angles. The apparatus can also be used to accurately measure the distance between the probe measurement head and a target surface.
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