Layered beam measurement apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7730630
SERIAL NO

11556381

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Abstract

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A new and improved tape rule that increases stiffness and standout length over standard tape rules is disclosed. The tape rule includes a primary rule and a secondary rule, the secondary rule providing increased strength. This invention can provide a variety of benefits, including increased blade flexibility while performing short extension related tasks, increased standout and reduced sag while performing tasks requiring longer extensions, reduced size and weight for tasks requiring the longest extensions and adds the ability to utilize alternate measurement methods or units and built in computational references.

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Patent Owner(s)

Patent OwnerAddress
D2M INTERNATIONAL PTY LTD702-703 7F OCEAN CENTRE 5 CANTON ROAD KOWLOON

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fleming, Heather Palo Alto, US 8 39
Lamb, Brian Menlo Park, US 26 364
Titzler, David Palo Alto, US 34 455

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