Method for classifying scientific materials such as silicate materials, polymer materials and/or nanomaterials
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United States of America Patent
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May 11, 2010
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app pub date -
Jan 23, 2007
filing date -
Jan 23, 2007
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Abstract
A method is provided for characterizing a scientific material, such as a silicate material, a polymer material and/or nanomaterial. The method can include the steps of irradiating a measuring light of a predetermined wavelength range into material specimens, recording the measuring light reflected and/or reemitted by the material specimens, determining a ratio depending on the wave lengths of irradiated to detected measuring light (spectrum), and numerical-mathematical processing of spectral data of single material specimens for determining the characteristic features of the material specimens.
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