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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
HAMMERSMITH IMANET LIMITED	DICANE ROAD CYCLOTRON BUILDING HAMMERSMITH CAMPUS LONDON W12 ONN

International Classification(s)

• G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Thielemans, Kris Filip Johan Jules	London, GB	17	302
Tsoumpas, Charalampos	London, GB	2	8

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
May 11, 2010	US,7714291,B2   US7714291B2	GRANTED PATENT AS SECOND PUBLICATION
September 18, 2008	US,20080224050,A1   US20080224050A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7714291

Method of and software for calculating a scatter estimate for tomographic scanning and system for tomographic scanning

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