Method of and circuit for sampling a frequency difference in an integrated circuit

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United States of America Patent

PATENT NO 7711328
SERIAL NO

11360321

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Abstract

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A method of sampling a frequency difference in an integrated circuit is disclosed. The method comprises the steps of receiving a clock signal in a first clock domain; comparing a count of the clock signal in the first clock domain to a predetermined value N; converting the result of the comparison to a second clock domain; and generating an error signal representing the difference between the count of the first clock signal and the count of a second clock signal in the second clock domain. A circuit for sampling a frequency difference in an integrated circuit is also disclosed.

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Patent Owner(s)

Patent OwnerAddress
XILINX INC2100 LOGIC DRIVE SAN JOSE CA 95124

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Samad, Maheen A Mountain View, US 8 54

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