Test strip reader system and method
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United States of America Patent
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May 4, 2010
Issued Date -
N/A
app pub date -
Jul 7, 2006
filing date -
Jul 8, 2005
priority date (Note) -
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Abstract
A system and method is provided for reading a test strip by measuring the light intensity incident on a photodiode. The method may include reverse biasing the photodiode, measuring a time required to charge a capacitor using current generated by the photodiode, and using the time required to charge the capacitor to determine a condition of the test strip. The system may include a photodiode being reverse biased and a capacitor being charged by the reversed biased photodiode. The length of time to charge the capacitor may be proportional to the light intensity incident on the photodiode and may be used to determine a condition of the test strip.
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