Microscopic cell observation and inspection system using a plurality of observation methods
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United States of America Patent
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Apr 27, 2010
Grant Date -
Feb 26, 2009
app pub date -
Sep 13, 2006
filing date -
Sep 26, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention relates to a microscopic cell observation and inspection system that uses a total internal reflection cell illuminator that is capable of freely changing an observation position without recourse to any special slide glass, makes sure high SN-ratio observation and facilitates sample manipulation, thereby making high-sensitivity, fast detection of a lot of cell reactions on the same slide glass. While, in response to a command from personal computer (80), step motors (53, 54) are driven to sequentially scan observation positions of cell sample (S) on slide glass (21), one of shutter units (71) and (72) is closed and the other is opened at high speed, whereby either one of illumination optical paths for a TIRF microscope and a drop fluorescence microscope is selected to illuminate cell sample (S) on that observation position. When the drop fluorescence microscope is chosen, filter unit (66) is driven to choose the wavelength of excitation light from drop fluorescence illumination light source (65), so that observation and inspection of cell sample (S) under the TIRF microscope and drop fluorescence microscope can be implemented in an alternate fast switchover way.
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