Method for performing power diffraction analysis
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United States of America Patent
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Apr 20, 2010
Issued Date -
N/A
app pub date -
Jan 15, 2003
filing date -
Jan 15, 2002
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Abstract
A method for successively performing a powder diffraction analysis of at least two powder samples being contained in sample holding means. Use is made of an apparatus comprising:—a source of radiation being adapted to direct a radiation beam to a power sample,—a detector for detecting diffraction radiation of a powder sample,—a drive means associated with said sample holding means for effecting a movement of an irradiated powder sample during irradiation and detection. The method comprises the steps of irradiating a powder sample and detecting the diffraction radiation of the powder sample, arranging a further powder sample such that said radiation beam is directed to said further powder sample, and irradiating said further powder sample and detecting the diffraction radiation of said further sample. During irradiation and detecting of each sample the drive means effect a movement of the irradiated sample with respect to the radiation beam for the purpose of improving particle statistics. The sample holding means comprise a common multiple samples holder holding said at least two powder samples. Said drive means effect, during irradiation and detection of a sample contained in said common multiple samples holder, a movement of said common multiple samples holder with respect to the radiation beam.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
VERTICAL ANALYTICS LLC | 6136 FRISCO SQUARE BLVD SUITE 385 FRISCO TX 75034 |
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Blomsma, Erwin | Haarlem, NL | 10 | 16 |
van, Langevelde Adriaan Jan | Almere, NL | 10 | 23 |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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