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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
OXIDE CORPORATION	1747-1 MAKIHARA MUKAWA-CHO HOKUTO-SHI YAMANASHI 4080302

International Classification(s)

• G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Aoshima, Masahiro	Tsukuba, JP	23	73
Ishibashi, Hiroyuki	Hitachinaka, JP	41	298
Nachimuthu, Senguttuvan	Tsukuba, JP	1	37
Shimizu, Shigenori	Tsukuba, JP	16	443
Sumiya, Keiji	Tsukuba, JP	27	296

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
April 06, 2010	US,7692153,B2   US7692153B2	GRANTED PATENT AS SECOND PUBLICATION
March 20, 2008	US,20080067391,A1   US20080067391A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7692153

Scintillator crystal and radiation detector

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