Failsafe mechanism for preventing an integrated circuit from overheating
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United States of America Patent
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Apr 6, 2010
Grant Date -
Feb 7, 2008
app pub date -
Oct 1, 2007
filing date -
Mar 11, 2003
priority date (Note) -
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Abstract
Techniques for preventing an integrated circuit (IC) from overheating are described herein. According to one embodiment, an exemplary process includes detecting whether a temperature of an integrated circuit (IC) exceeds a threshold independent of an operating state of the IC, and removing at least a portion of a power from the IC if the temperature of the IC exceeds the threshold. Other methods and apparatuses are also described.
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