Element analysis device
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United States of America Patent
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Mar 30, 2010
Grant Date -
Sep 4, 2008
app pub date -
Apr 15, 2005
filing date -
Apr 17, 2004
priority date (Note) -
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Abstract
Described is an element analysis device, which can be used to obtain precise measurements even under unfavorable environmental conditions. For this, the device is provided with a transporting means with a measuring region (14) for transporting the substance (S) to be measured, an excitation source with an exit window located in a first case (22) and an X-ray fluorescence detector (30) that is directed toward the measuring region (14), as well as an entrance window (34) that is located in a second case (32). To minimize the air absorption and prevent dust and dirt from being deposited, a tube (40, 50) extends from the entrance window (34) and/or the exit window (24) in the direction of the measuring region, which tube is essentially tightly connected to the respective case (22, 32) and is open at the end facing the measuring region and is provided with a connection (44, 54) for feeding a flushing gas into the tube (FIG. 1).
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