Measuring head for nanoindentation instrument and measuring method using same
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United States of America Patent
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Mar 30, 2010
Grant Date -
Oct 22, 2009
app pub date -
Nov 16, 2005
filing date -
Dec 23, 2004
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Abstract
A measuring head for a nano-indentation instrument capable of positioning a sample relatively to the measuring head, which includes a measuring axis, a reference axis and a component for detecting a depth of penetration of an indentor into the sample. The measuring and reference axes are attached to a frame for connection to the instrument. The measuring axis incorporates an actuator and includes the indentor, the reference axis incorporates an actuator and includes a reference tip, and the measuring and reference axes each have a component for detecting a force applied by its actuator. Penetration depth is detected by measuring a displacement of the indentor relatively to the reference tip.
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