Method and system for perpendicular magnetic media metrology

United States of America Patent

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Mar 23, 2010
Grant Date
Nov 15, 2007
app pub date
Mar 28, 2007
filing date
May 11, 2006

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Expired

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Abstract

A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.

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Patent Owner	Address
MICROSENSE LLC	1 VAN DE GRAAFF DRIVE BURLINGTON MA 01890

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G11B:INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BET....

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Inventor Name	Address	# of filed Patents	Total Citations
Drent, William Van	Best, NL	1	4
Vajda, Ferenc	Winchester, US	3	60

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Method and system for perpendicular magnetic media metrology

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United States of America Patent

11692762

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PATENT NO	7684145
APP PUB NO	20070262771A1
SERIAL NO	11692762
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
March 23, 2010	US,7684145,B2 US7684145B2	GRANTED PATENT AS SECOND PUBLICATION
November 15, 2007	US,20070262771,A1 US20070262771A1	FIRST PUBLISHED PATENT APPLICATION

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11692762

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