Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chip
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United States of America Patent
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Feb 16, 2010
Grant Date -
Jan 31, 2008
app pub date -
Oct 2, 2007
filing date -
Dec 1, 2000
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Abstract
In the manufacturing process of a semiconductor integrated circuit device, a plurality of identification elements having the same arrangement are formed and the relation of magnitude in a physical amount corresponding to variations in the process of the plurality of identification elements is employed as identification information unique to the semiconductor integrated circuit device.
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