Substrate damage detection mechanism using RFID tag

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7663491
APP PUB NO 20080061972A1
SERIAL NO

11512281

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Abstract

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Disclosed is a substrate damage detection mechanism using Radio Frequency Identification (RFID) tag including a substrate, at least one RFID tag with a RFID chip, a RFID transmitter and at least one data input/output port and at least one conducting circuit loop arranged to cover the substrate and provided with a first end that is electrically connected to a reference voltage and a second end that is electrically connected to the data input/output port of the RFID tag. The RFID chip generates a conductive code when the conducting circuit loop is originally conducting and generates a open-circuit code when the conducting circuit loop becomes open circuit resulting from the damage of the substrate in which both the conductive code and the open-circuit code are transmitted by the RFID transmitter and received by a RFID reader to determine the damage of the substrate.

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Patent Owner(s)

Patent OwnerAddress
CHUNG HUA UNIVERSITY707 SEC 2 WUFU RD HSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Jwu-E Hsin Chu, TW 5 103
Chen, Tung-Chou Hsin Chu, TW 5 113
Chiu, Chien-Jung Hsin Chu, TW 9 107
Chung, In-Hang Hsin Chu, TW 4 102
Hwang, Chi-Kuang Hsin Chu, TW 13 235
Lee, Bore-Kuen Hsin Chu, TW 4 102
Tien, Ching-Cheng Hsin Chu, TW 13 256
Wang, Chih-Hu Hsin Chu, TW 4 84
Wu, Chia-Wen Hsin Chu, TW 21 167
Yen, Ming-Ching Hsin Chu, TW 11 133

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