Method and apparatus for on-chip measurement of power amplifier AM/AM and AM/PM non-linearity
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United States of America Patent
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Jan 26, 2010
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Sep 20, 2007
app pub date -
Mar 16, 2006
filing date -
Mar 16, 2006
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Abstract
An apparatus and method for characterizing an amplifier transmitting a band limited signal using a sample of the input signal to the amplifier and a sample of the output signal from the amplifier, where the output signal is sub-sampled. The sub-sampling frequency is chosen such that images of the band limited signal do not overlap. The input signal and the output signal in a polar format are processed to determine characteristics such AM/AM and AM/PM conversion nonlinearities.
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