Inline inspection of photovoltaics for electrical defects
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United States of America Patent
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Jan 19, 2010
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N/A
app pub date -
Mar 24, 2007
filing date -
Mar 24, 2007
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Abstract
A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.
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