Method for fabricating a semiconductor device

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United States of America Patent

PATENT NO 7648867
APP PUB NO 20080188066A1
SERIAL NO

12027430

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Abstract

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A method for fabricating a semiconductor device includes: forming a dummy gate that defines a region in which a gate electrode should be formed on a semiconductor substrate; forming a surface film on the semiconductor substrate by directional sputtering vertical to a surface of the semiconductor substrate, the directional sputtering being one of collimate sputtering, long throw sputtering and ion beam sputtering; removing the surface film formed along a sidewall of the dummy gate; removing the dummy gate; and forming the gate electrode in the region from which the dummy gate on the semiconductor substrate has been removed.

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Patent Owner(s)

Patent OwnerAddress
EUDYNA DEVICES INCYAMANASHI PREFECTURE YAMANASHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Watanabe, Masataka Yamanashi, JP 62 215
Yano, Hiroshi Yamanashi, JP 139 1102

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