Scanning probe with constant scanning speed
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United States of America Patent
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Jan 19, 2010
Grant Date -
Oct 23, 2008
app pub date -
Mar 21, 2008
filing date -
Apr 18, 2007
priority date (Note) -
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Abstract
A method for scanning a surface of a workpiece 1 at a constant scanning speed /v.sub.a/ using a scanning probe 2 mounted on a support 3 on a coordinate measuring machine (CMM) 4. The CMM contains a first set of drive means (6, 7, 8) to move the support according to three linear axis (x,y,z), and the support 3 contains a second set of drive means (14, 17) for actuating the movement of the scanning probe 2 with two degrees of freedom relative to said support 3. The method involves control means 33 coupled to the sets of drive means (6, 14, 17), and memory means for storing theoretical profiles and coordinates of the surface to scan.
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