Goniometer
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United States of America Patent
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Jan 12, 2010
Grant Date -
Dec 20, 2007
app pub date -
Nov 24, 2005
filing date -
Nov 29, 2004
priority date (Note) -
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Abstract
The invention relates to a goniometer (1) and a method for measuring stresses and characterizing microstructure of particles. The goniometer comprises frame (4), a measurement head (7, 8, 9, 10) movably adapted to the frame (4) by a first linear movement unit (5), second linear movement unit (6) and a tilting movement unit (16), for performing measurement at a measurement point. According to the invention the axis of rotation (12) of the tilting movement unit (16) does not coincide with the measurement point, and the device has means (17) for creating arc-formed movement of the measurement head (7, 8, 9, 10) during the measurement with said movement units (5, 6, 16).
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