Temperature measurement using changes in dielectric constant and associated resonance
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United States of America Patent
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Dec 29, 2009
Grant Date -
Jul 24, 2008
app pub date -
Apr 13, 2007
filing date -
Apr 13, 2006
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Abstract
A temperature measurement technique for calculating a temperature in a high temperature environment by monitoring a change in resonant frequency of a resonant structure loaded with a dielectric material. A response curve for a reflection coefficient S11 associated with the resonant structure is generated, typically by the use of a network analyzer connected to the resonant structure via a cable. A minimum point for the response curve is identified to detect the resonant frequency for the resonant structure. A calibration map is applied to the minimum point to identify a temperature associated with the resonant frequency of the resonant structure. The temperature associated with the resonant frequency of the resonant structure represents the temperature of the high temperature environment.
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