Optical apparatus and methods for performing eye examinations

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United States of America Patent

PATENT NO 7631970
APP PUB NO 20050203422A1
SERIAL NO

11056537

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Abstract

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An eye examination system is presented that obtains several parameters of the eye. A system according to some embodiments of the present invention include a keratometry system, a low coherence reflectometry system, and a low coherence interferometry system co-coupled to the eye. In some embodiments, the low coherence interferometry system can provide interferometric tomography data. A processor can be coupled to receive data from the keratometry system, the low coherence reflectometry system, and the low coherence interferometry system and calculate at least one parameter of the eye from that data.

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Patent Owner(s)

Patent OwnerAddress
CARL ZEISS MEDITEC INC5160 HACIENDA DRIVE DUBLIN CA 94568

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wei, Jay Fremont , US 40 2887

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