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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
HORIBA ADVANCED TECHNO CO LTD	KYOTO 601-8551

International Classification(s)

• G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Iwamoto, Yasukazu	Kyoto , JP	29	96
Kakiuchi, Takashi	Kyoto , JP	63	1118
Nomura, Satoshi	Kyoto , JP	39	374
Shibata, Manabu	Kyoto , JP	58	469
Yamanuki, Mikito	Kyoto , JP	3	22

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
December 08, 2009	US,7628901,B2   US7628901B2	GRANTED PATENT AS SECOND PUBLICATION
January 03, 2008	US,20080000771,A1   US20080000771A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7628901

Reference electrode, salt bridge and ionic concentration measuring device by the use of reference electrode and salt bridge

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