Polarization interference microscope
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United States of America Patent
Stats
-
Dec 1, 2009
Grant Date -
Oct 25, 2007
app pub date -
Apr 10, 2007
filing date -
Apr 11, 2006
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The present invention relates to a polarization interference microscope (1) for imaging objects (5). The polarization interference microscope (1) comprises a light source (2), an illumination beam path (6), an imaging beam path (7) and an objective (4). The illumination beam path (6) extends from the light source (2) to the object (5). The imaging beam path (7) extends from the object (5) to a detector or a tube (3). At least one polarization means (9) is provided in the illumination beam path (6) and/or in the imaging beam path (7), by which at least one polarization means the light of the respective beam path (6, 7) can be converted into a predeterminable polarization state. An analyzer means (10) is provided in the imaging beam path (7). A birefringent component is provided between the polarization means (9) and the analyzer means (10), by which birefringent component the light polarized by the polarization means (9) can be divided into two partial beams (13, 14) having different polarization directions. The component can produce a splitting between the two partial beams (13, 14). The present invention furthermore relates to a retrofit kit for a conventional microscope and for a conventional polarization interference microscope, respectively, and a method for imaging objects. In order to enable variable contrasting of the interference contrast, the polarization interference microscope (1) according to the invention is characterized by the fact that the component has a liquid crystal element (11, 21, 23) formed in such a way that the value of the splitting between the two partial beams (13, 14) is settable in a variable manner thereby.

First Claim
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
LEICA MICROSYSTEMS CMS GMBH | ERNST-LEITZ-STRASSE 17-37 35578 WETZLAR WETZLAR |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Krüger, Ralf | Butzbach/griedel , DE | 2 | 1 |
Schulz, Christian | Solms/albshausen , DE | 68 | 2800 |
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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