Method and apparatus for testing an IC device based on relative timing of test signals
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United States of America Patent
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Nov 24, 2009
Grant Date -
May 1, 2008
app pub date -
Oct 31, 2006
filing date -
Oct 31, 2006
priority date (Note) -
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status (Latency Note)
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Abstract
An apparatus for testing an IC device includes a test signal generator for generating a predefined sequence of test signals that are input to the IC device. A timing skew monitor is provided for monitoring the test signals input in the IC device and a signal output from the IC device for a predetermined time period, and creating an array indicating an execution or a nonexecution of signal timing combinations of one of the test signals relative to at least one of the other test signals within the predetermined time period by the IC device. A determination as to whether the desired signal timing combinations of the test signals have been executed by the IC device is made by an operator.
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International Classification(s)
- H03M:CODING, DECODING OR CODE CONVERSION, IN GENERAL
- G01M:TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR S....
- G06F:ELECTRIC DIGITAL DATA PROCESSING
- G01P:MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, D....
- G11B:INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BET....
- G04F:TIME-INTERVAL MEASURING
- G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....
- G01D:MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VAR....
- G04G:ELECTRONIC TIME-PIECES
- G06K:RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD ....
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