Method for marking defect and device therefor
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United States of America Patent
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Oct 6, 2009
Grant Date -
Apr 2, 2009
app pub date -
Aug 13, 2008
filing date -
Mar 18, 1999
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Abstract
A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
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