Apparatus and method for determining air-kerma rate
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United States of America Patent
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Oct 6, 2009
Grant Date -
May 7, 2009
app pub date -
Nov 7, 2007
filing date -
Nov 7, 2007
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Abstract
An apparatus for determining the air-kerma rate of an x-ray device comprises a data obtaining component for obtaining data of the x-ray device, a calculation component for calculating the air-kerma rate from the obtained data, and an outputting component for outputting the calculated air-kerma rate, where the calculation component uses an algebraic formula for the calculation of the air-kerma rate.
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