Abnormality diagnostic method and device thereof
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United States of America Patent
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Aug 11, 2009
Grant Date -
Apr 17, 2008
app pub date -
Oct 5, 2007
filing date -
Oct 12, 2006
priority date (Note) -
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Abstract
An abnormality diagnostic device selects a previously stored diagnostic measuring orbit (S110), and makes a machine to perform a specified operation for diagnosis so as to measure a driving power value of an actuator (S120). In S140, the abnormality diagnostic device compares the measured driving power value and a driving power value at the time of normal driving, and extracts a non-corresponding portion as a characteristic point based on a previously set determination criteria. When the extracting of the characteristic point is confirmed in S170, the abnormality diagnostic device compares the extracted characteristic point with a characteristic point predicted to occur in a driving power value at a time of occurring abnormality in a mechanism element, and calculates an evaluation index from a corresponding degree of both. When the evaluation index is a threshold value or more in S180, the abnormality diagnostic device estimates a mechanism element having an abnormality in S190.
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