Method for the determination of the quality of a set of properties, usable for the verification and specification of circuits

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United States of America Patent

PATENT NO 7571398
APP PUB NO 20070226663A1
SERIAL NO

11459433

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Abstract

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, is described to such an accurate extent that one property Q exists, which represents this aspect without being dependant on the internal signals. The procedure is capable of providing a measurement and can particularly be used in the verification and specification of circuits.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS ELECTRONIC DESIGN AUTOMATION GMBH80634 MÜNCHEN

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bormann, Jörg Gistlstrasse 55A 2 17
Busch, Holger Ludwig-Thoma-Strasse 14 10 52

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