Position control for scanning probe spectroscopy

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United States of America Patent

PATENT NO 7569077
APP PUB NO 20080308718A1
SERIAL NO

11763677

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Abstract

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A method of position control for scanning probe spectroscopy of a specimen. Probe positional error is determined by comparing images generated from a sequence of scans to identify differences between positions of at least a portion of a reference characteristic of the specimen in the images. A probe is moved to a target location for spectroscopic analysis, as a function of the determined probe positional error.

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Patent Owner(s)

Patent OwnerAddress
RHK TECHNOLOGY INC1050 EAST MAPLE ROAD TROY MI 48083

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kollin, Adam Troy , US 5 173

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