System and method for analysis of gemstones
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United States of America Patent
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Jul 7, 2009
Grant Date -
N/A
app pub date -
May 6, 2005
filing date -
May 8, 2004
priority date (Note) -
Expired
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Abstract
A system for analyzing the chemical composition of a sample, comprising exciting a portion of the sample to generate atomic spectral emissions; a spectrometer for determining atomic emission characteristics; processor for receiving an output from the spectrometer, analyzing said output to determine atomic composition, said processor predicting at least one of (i) an origin of the sample, (ii) a treatment applied to said sample, (iii) a composition of the sample, and (iv) a feedback signal for controlling a process. Calibration samples are also provided for standardizing readings from the spectrometer.
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