Surface plasmon resonance phenomenon measuring equipment

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United States of America Patent

PATENT NO 7545500
APP PUB NO 20080291453A1
SERIAL NO

11570654

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Abstract

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The present invention discloses surface plasmon resonance phenomenon measuring equipment comprising: (1) a prism, (2) a sensor wherein a plurality of measuring cells are formed in m rows and n columns on the bottom face of the prism, (3) a light source for radiating a laser beam, (4) a first optical system wherein m optical units each having a rectangular parallelepiped shape and having a translucent film formed along the diagonal surface of the rectangular parallelepiped are arranged continuously, (5) a second optical system wherein mn optical units are arranged continuously and a reflected lights group is radiated toward the measuring cells, (6) a photodiode array detectors group of m rows and n columns, arranged on the extensions of reflected lights group, and (7) a polarizer interposed between the first optical system and the prism, and/or between the prism and the photodiode array detectors.

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Patent Owner(s)

Patent OwnerAddress
KYUSHU UNIVERSITY NATIONAL UNIVERSITY CORPORATIONFUKUOKA-SHI FUKUOKA 812-8581
MEBIUS ADVANCED TECHNOLOGY LTD3-31-6 NISHIOGI-KITA SUGINAMI-KU TOKYO 167-0042
MURORAN INSTITUTE OF TECHNOLOGY NATIONAL UNIVERSITY CORPORATION27-1 MIZUMOTO-CHO MURARAN-SHI HOKKAIDO 050-8585

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Asano, Yasukazu Saitama , JP 2 10
Hemmi, Akihide Tokyo , JP 1 1
Imato, Toshihiko Fukuoka , JP 2 10
Kaneki, Noriaki Hokkaido , JP 1 1
Shimada, Kouji Hokkaido , JP 4 20
Uchiyama, Katsumi Tokyo , JP 8 55

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