Condition-analyzing device
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United States of America Patent
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Jun 9, 2009
Grant Date -
Dec 14, 2006
app pub date -
Jun 3, 2004
filing date -
Jun 9, 2003
priority date (Note) -
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Abstract
A condition analysis apparatus capable of grasping the condition of an object easily and accurately is provided. The condition analysis apparatus 1 includes a three-dimensional sensor 10 for measuring sampling-point-moves in the height direction of an object 2 existing in a target area at a plurality of sampling points, and area definition means 22 for defining an area where a plurality of the sampling-point-moves are in the generally same phase. The thus constructed condition analysis apparatus 1 can grasp the condition of the object 2 easily and accurately. Preferably, the condition analysis apparatus 1 includes information output means 40 for outputting information of an area including the area defined by the area definition means 22.
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