Deposition methods and stacked film formed thereby

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United States of America Patent

PATENT NO 7544273
APP PUB NO 20040067386A1
SERIAL NO

10467337

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Abstract

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A method of making a film having a uniform thickness and having a crystal axis parallel to a main surface of a substrate is described. In a deposition method, a film is formed by scattering a deposition material from a target (12) surface and growing the scattered deposition material on a main surface (100a) of a substrate (100). The method includes the steps of positioning the substrate (100) into a first state where the distance between one end (100f) and the target (12) is small and the distance between the other end (100e) and the target material (12) is relatively large, forming a first film (110) on the substrate (100) in the first state, positioning the substrate (100) into a second state where the distance between one end (100f) and the target (12) is large and the distance between the other end (100e) and the target (12) is small, and. forming a second film (120) on the first film (110) in the second state.

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Patent Owner(s)

Patent OwnerAddress
SUMITOMO ELECTRIC INDUSTRIES LTDOSAKA
INTERNATIONAL SUPERCONDUCTIVITY TECHNOLOGY CENTER THE JURIDICAL FOUNDATIONTOKYO 105-0004

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujino, Koso Osaka , JP 6 9
Ohmatsu, Kazuya Osaka , JP 32 190
Taneda, Takahiro Osaka , JP 4 14

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