Magnetic tunnel junction sensor
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United States of America Patent
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Jun 2, 2009
Grant Date -
Feb 1, 2007
app pub date -
Jul 29, 2005
filing date -
Jul 29, 2005
priority date (Note) -
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Abstract
Methods and apparatus are provided for sensing physical parameters. The apparatus comprises a magnetic tunnel junction (MTJ) and a magnetic field source whose magnetic field overlaps the MTJ and whose proximity to the MTJ varies in response to an input to the sensor. The MTJ comprises first and second magnetic electrodes separated by a dielectric configured to permit significant tunneling conduction therebetween. The first magnetic electrode has its spin axis pinned and the second magnetic electrode has its spin axis free. The magnetic field source is oriented closer to the second magnetic electrode than the first magnetic electrode. The overall sensor dynamic range is extended by providing multiple electrically coupled sensors receiving the same input but with different individual response curves and desirably but not essentially formed on the same substrate.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
EVERSPIN TECHNOLOGIES INC | 5670 W CHANDLER BLVD SUITE 100 CHANDLER AS 85226 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Baird, Robert W | Gilbert, US | 33 | 524 |
Chung, Young Sir | Chandler, US | 25 | 572 |
Engel, Bradley N | Chandler, US | 40 | 1527 |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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