X-ray diffraction apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 19, 2009
Grant Date -
Jan 4, 2007
app pub date -
Jun 28, 2006
filing date -
Jun 30, 2005
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An X-ray diffraction apparatus allows plural kinds of characteristic X-rays to be incident on a sample at the same time and thus allows X-ray diffraction measurement with the plural kinds of characteristic X-rays to be carried out at the same time. An X-ray tube includes an anode which has the first target region made of Co and the second target region made of Cu. The first and second target regions are sectioned in a direction (Z-direction) perpendicular to an X-ray take-off direction. Incident-side and receiving-side Z-direction-divergence restriction devices restrict the X-ray divergence in the Z-direction. An X-ray detector is position sensitive at least in the Z-direction and can detect separately a diffracted X-ray coming from the first sample region which is irradiated with the Co characteristic X-ray and another diffracted X-ray coming from the second sample region which is irradiated with the Cu characteristic X-ray. The detector may be a two-dimensional CCD sensor capable of executing a TDI operation.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully