Method and system for the inspection of integrated circuit devices having leads
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United States of America Patent
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May 19, 2009
Grant Date -
Aug 28, 2008
app pub date -
Feb 26, 2007
filing date -
Feb 26, 2007
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention relates to optical inspection of integrated circuit devices, such as QFP and TSOP devices. There are provided methods of inspecting objects, such as integrated circuit devices, using a single laser triangulation system oriented in a fixed direction, where the given inspection system rotates the inspection tray for scanning the objects placed therein in different directions.
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