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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
UOP LLC	ILLINOIS AMERICA ILLINOIS

International Classification(s)

• G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
• G01G:WEIGHING

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Akporiaye, Duncan E	Oslo , NO	26	189
Blom, Richard	Oslo , NO	12	53
Dahl, Ivar M	Oslo , NO	33	214
Fismen, Britta G	Oslo , NO	3	7
Gulliksen, Morten	Oslo , NO	9	31
Johansen, Ib-Rune	Oslo , NO	47	1001
Karlsson, Arne	Oslo , NO	47	370
Plassen, Martin	Oslo , NO	8	15
Wang, Dag T	Oslo , NO	4	14
Wendelbo, Rune	Oslo , NO	21	229

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
May 19, 2009	US,7533587,B2   US7533587B2	GRANTED PATENT AS SECOND PUBLICATION
October 25, 2007	US,20070245840,A1   US20070245840A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7533587

Method and apparatus for mass analysis of samples

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