Method and apparatus for monitoring element alignment
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United States of America Patent
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May 12, 2009
Grant Date -
Nov 16, 2006
app pub date -
Mar 8, 2004
filing date -
Mar 14, 2003
priority date (Note) -
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status (Latency Note)
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Abstract
The present invention relates to a method of measuring the difference in alignment between a first plan position of an element (1) and a second plan position of an element, the method comprising the use of: i) at least one rigid or taut connection (4) extending between a first point (2) at the level of the first plan position and a second point (3) at the level of the second plan position, the first and second points being at an identical displacement from the element; and ii) one or more electrolevel gauges (5) provided on the or each rigid or taut connection, so as to measure the inclination of the rigid or taut connection.
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