Analog-to-digital converter system with increased sampling frequency
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United States of America Patent
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May 5, 2009
Grant Date -
Sep 25, 2008
app pub date -
Mar 22, 2007
filing date -
Mar 22, 2007
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Abstract
An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using a different ADC for each sampling, wherein each sampling is sequentially offset a certain amount of time from the most recent preceding sampling. The samplings from the multitude of ADCs are combined to form a single contiguous digital output signal. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a specified permittivity material device, and a sequencer or multiplier.
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