Methods and apparatus for the improved measurement of circular and linear dichroism and uses thereof
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United States of America Patent
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Apr 21, 2009
Grant Date -
Jun 29, 2006
app pub date -
Feb 21, 2006
filing date -
Aug 23, 2004
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Abstract
The present invention is directed generally to an apparatus and methods that combine a novel four-port dual-source interferometer with double modulation FT-VCD or FT-VLD measurements to obtain a spectrometer with enhanced signal quality (S/N), and lower susceptibility to detector saturation. In the novel apparatus of the present invention, a linear polarizer or tandem array of identically-oriented polarizers is placed in front of each of the two sources in a four-port dual-source interferometer, with the polarization state of one of the linear polarizers (or tandem array of polarizers) vertical and the polarization state of the other linear polarizer (or tandem array of polarizers) horizontal, i.e., with the polarization axes of the polarizers orthogonal to one another. Methods for measuring these spectra using the various aspects of the apparatus of the present invention are also provided.
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