Operational amplifier and scanning electron microscope using the same
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United States of America Patent
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Apr 21, 2009
Grant Date -
May 24, 2007
app pub date -
Nov 21, 2006
filing date -
Nov 24, 2005
priority date (Note) -
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Abstract
An operational amplifier and a scanning electron microscope which are capable of dealing with high voltage and large current, and which allow implementation of stable and precise amplification, the operational amplifier having a first-stage amplification unit including a differential pair, a base-grounded amplification circuit, and an active load, the base-grounded amplification circuit being cascode-connected to the differential pair a second-stage amplification unit including an inverter having an emitter follower circuit and a constant-current load circuit, and a third-stage amplification unit including a source follower circuit or an emitter follower circuit.
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