Methods and apparatus for time-of-flight mass spectrometer
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United States of America Patent
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Apr 14, 2009
Grant Date -
Apr 17, 2008
app pub date -
Oct 11, 2006
filing date -
Oct 11, 2006
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Abstract
Disclosed is a method of determining when to calibrate a time-of-flight mass spectrometer. In various embodiments, the method comprises storing within a controller a set of parameters for the mass spectrometer; providing an updated set of parameters while retaining at least one set of previously stored parameters; computing at least one rate of change of the updated set of parameters with respect to the at least one set of previously stored parameters; and determining when to calibrate the mass spectrometer from the results of computing the rate of change of at least one of the parameters. In various embodiments, a parameter stored can be a set of temperatures derived from obtaining system temperature measurements of those components whose changing temperature is an indication of mass drift. In various embodiments, the controller can store a history of calibration factors and temperatures over time, can calculate the time rate of change of the calibration factors and the temperature to estimate the mass drift rate of the instrument and compare the drift rate to a predetermined mass error limit for determining when re-calibration can be scheduled.
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