Pattern correction circuit
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United States of America Patent
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Mar 31, 2009
Grant Date -
N/A
app pub date -
Jul 29, 2005
filing date -
Jul 29, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method is described for facilitating use of a first pattern utilizing XOR data formatting in an electronic tester. The method includes dividing the first pattern into at least a first group and a second group, the tester to successively execute the first group and the second group. The method further includes assuming an entry state for each group is one of two binary conditions and inverting programmed commands for the second group if an ending state of the first group is not equal to the assumed entry state.
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