Semi-automatic multiplexing system for automated semiconductor wafer testing
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United States of America Patent
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Mar 31, 2009
Grant Date -
May 10, 2007
app pub date -
Nov 8, 2005
filing date -
Nov 8, 2005
priority date (Note) -
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Abstract
A semi-automatic multiplexing system for automated semiconductor wafer testing employs a jumper block for each device type in the semiconductor wafer to be tested, each jumper block having inputs for receiving a test input/output line, a plurality of block contacts corresponding to pads of a device to be tested, and manually set connectors or jumper cables for selectively interconnecting jumper block inputs to block contacts. A multiplexer is then used for selectively connecting tester input/output lines to the jumper blocks, thereby reducing the number of relays required for connecting test signals to the devices in the semiconductor wafer.
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