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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
VAISALA OYJ	P O BOX 26 HELSINKI 00421

International Classification(s)

• G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Paukkunen, Ari	Vantaa , FI	6	50

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
March 31, 2009	US,7509838,B2   US7509838B2	GRANTED PATENT AS SECOND PUBLICATION
March 27, 2008	US,20080072669,A1   US20080072669A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7509838

Correction of humidity measurement results of a radiosonde

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