Method and system for testing memory modules
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United States of America Patent
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Mar 24, 2009
Grant Date -
Jan 24, 2008
app pub date -
Jun 29, 2006
filing date -
Jun 29, 2006
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and system for testing memory modules is disclosed. The system includes a memory module and a connector configured to receive the module. The memory module is configured to operate in two modes: In the first operation mode the module uses a frequency between a low frequency and a high frequency. In the second operation mode, the module uses a frequency lower than the lower frequency. A control circuit is coupled to the connector. The control circuit is configured to apply a control signal to the circuit module when the circuit module is received in the connector. When the circuit module is received in the connector, the control signal is applied. This applied control signal causes the module to operate in the second operation mode.
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