Device and method for the measurement of the curvature of a surface
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United States of America Patent
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Mar 17, 2009
Grant Date -
Feb 8, 2007
app pub date -
May 12, 2006
filing date -
May 13, 2005
priority date (Note) -
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Abstract
The invention relates to a device and a method for the measurement of the curvature of a surface (1), which is more exact and less expensive than prior art devices. The device comprises a light source (2) for the irradiation of a light beam (3) onto the surface (1), in which a birefingent element (4) is arranged between light source (2) and surface (1), in which furthermore a detector (5) is arranged for the detection of the partial beams (6,7), that are reflected from the surface (1), and at least one main axis (17) of the birefringent element (4) is positioned with respect to the light beam (3) of the light source (2) in such a way, that the light beam (3) of the light source (2) is split up into at least two parallel beams (6,7).
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